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Facilities

Mobirise

Material Preparation and Characterization

Full access is available to the following facilities through VCU’s Nano Characterization Center (NCC) user facility:

  • Hitachi SU-70 cold field emission SEM with EDS and electron beam lithography system.
  • JEOL JSM 5610-LV SEM with Oxford EDS. 
  • Veeco IKONtm AFM system (used for both AFM and MFM studies). 
  • ESCAlab 250 X-ray photoelectron spectrometer. 
  • Anton Parr SAXSESS small angle x-ray scattering system. 
  • PANalytical XRD system 
  • Zeiss Libra 120 TEM 
  • Quantum Design Versalab VSM 
  • Various DC and RF sputtering systems 
  • Temperature variable Atomic and Magnetic Force Microscope 
  • Atomic Layer Deposition 
  • MRC 603 Sputtering System 
  • Dual E-beam/Thermal Evaporator 
  • Environment controlled glove boxes 
  • Spin coaters and other sample preparation facilities 
  • Dynacool, 9 tesla magnetometer with heat capacity, transport and magnetooptical options 
  • Tube furnace with high vacuum system
  • S-1160 Probe station
  • Hot isostatic press 

© Radhika Baura | VCU College of Engineering